Nanowerk

Critical Dimension Scanning Electron Microscopy (CD-SEM): Precision Metrology for Nanoscale Fabrication

In the world of nanotechnology, where structures are measured in billionths of a meter, precise imaging and measurement techniques are essential. Critical Dimension Scanning Electron Microscopy ...
AZoNano

Using SEM for Structural Analysis in Nanomaterials

Unlike optical microscopy, SEM does not rely on light waves but instead uses a beam of electrons to interact with materials, enabling magnifications up to 300,000× and resolutions approaching 1 nm. 1 ...
Nanowerk

Scanning Electrochemical Microscopy: Probing Interfaces at the Nanoscale

What is Scanning Electrochemical Microscopy? Scanning electrochemical microscopy (SECM) is a powerful analytical technique that combines the principles of electrochemistry and scanning probe ...
Michigan Technological University

FIB Form and Function 1

Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...